• DocumentCode
    3566815
  • Title

    Charge deposition distributions in targets irradiated by electrons

  • Author

    Lazurik, Valentin ; Moskvin, Vadim

  • Author_Institution
    Radiat. Phys. Lab., Kharkov State Univ., Ukraine
  • Volume
    2
  • fYear
    1996
  • Firstpage
    899
  • Abstract
    Charge deposition in targets consisting of materials with atomic numbers from 6 to 92 irradiated by normally impinging broad electron beams with energies from 0.1 to 10 MeV are studied. Using the modification of trajectory rotation method [Nucl. Instr. and Meth. B 108 (1996) 276] for the charge deposition calculations, the data on primary electron charge deposition distributions in target are obtained. An analysis of the mechanism of charge deposition distribution shaping in small-size spatial regions in a target is made. The role of stochastic wandering of electrons near the points where they deposit their charge is discussed for charge deposition near inhomogeneities in a target. In is noted that neglect of the electron stochastic wandering can lead to the artifacts in calculations and erroneous conclusions concerning charge deposition near interfaces in heterogeneous targets
  • Keywords
    Monte Carlo methods; electron beam effects; energy loss of particles; stochastic processes; 0.1 to 10 MeV; charge deposition distributions; heterogeneous targets; normally impinging broad electron beams; primary electron charge deposition distributions; stochastic wandering; trajectory rotation method; Atomic beams; Atomic layer deposition; Atomic measurements; Data analysis; Electron beams; Laboratories; Monte Carlo methods; Physics; Scattering; Stochastic processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium, 1996. Conference Record., 1996 IEEE
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-3534-1
  • Type

    conf

  • DOI
    10.1109/NSSMIC.1996.591487
  • Filename
    591487