Title :
Fault-tolerant medium-voltage power converters for high-capacity belt conveyor systems
Author :
Rocha, Anderson Vagner ; Filho, Braz Cardoso ; Pires, Igor Amariz ; De Paula, Helder
Author_Institution :
Dept. of Electr. Eng., CEFET-MG, Belo Horizonte, Brazil
Abstract :
The bulk materials transportation from the mines to their destination is an important activity that often represents the major part of the total mining costs. More and more frequently, high-capacity belt conveyors in mining are efficiently driven employing medium-voltage power converters connected with large induction motors. Unfortunately, medium-voltage power converters use a high number of power semiconductors which are ranked as the most fragile components of a drive system and the failure of any of these devices often causes a total collapse of the converter, resulting in the conveyor system downtime with large financial losses for companies. In this work the authors will present new design alternatives for the most used power converter technologies aiming its fault-tolerant and fault-resilient operation. As the total tolerance to any kind of failure is still a practical impossibility, in the cases where catastrophic failures cause the converter breakdown and the conveyor downtime, it will be shown how to limit the damage pattern in the equipment, minimizing the maintenance costs and time-to-repair.
Keywords :
conveyors; fault diagnosis; fault tolerance; induction motors; power convertors; power semiconductor devices; bulk materials transportation; converter breakdown; conveyor downtime; damage pattern; fault-resilient operation; fault-tolerant operation; high-capacity belt conveyors; large induction motors; maintenance costs; medium-voltage power converters; mining costs; power converter technologies; power semiconductors; Belts; Fault tolerance; Fault tolerant systems; Insulated gate bipolar transistors; Medium voltage; Topology; availability; fault detection; fault-tolerance; power converters; power semiconductor devices; reliability; resilience;
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
DOI :
10.1109/IECON.2014.7049176