DocumentCode :
3567120
Title :
Near real-time incipient fault detection in IGBT switches
Author :
O´Connor, Paul ; Cox, Robert W. ; Anderson, Jason M.
Author_Institution :
Dept. of Electr. & Comput. Eng., UNC Charlotte, Charlotte, NC, USA
fYear :
2014
Firstpage :
4484
Lastpage :
4491
Abstract :
The early detection of incipient faults is desirable in mission-critical applications such as shipboard propulsion drives. This paper presents an online condition-monitoring approach for detecting early stage faults in IGBTs. The proposed algorithm extracts important device features (i.e. on-state resistance, gate charge, etc.) and compares them to healthy values recorded over a range of operating conditions. The algorithm is based on principal-components analysis (PCA). An experimental implementation in an IGBT-based drive is described, and results recorded with two different faults over a range of operating conditions are presented. The scheme integrates well with new FPGA-based gate drives and provides a powerful alternative to rules-based fault detection.
Keywords :
condition monitoring; fault diagnosis; feature extraction; field programmable gate arrays; power semiconductor switches; principal component analysis; FPGA-based gate drives; IGBT switches; IGBT-based drive; PCA; device features extracts; early stage fault detection; field programmable gate arrays; healthy value recording; mission-critical applications; near real-time incipient fault detection; online condition-monitoring approach; operating conditions; principal-components analysis; rules-based fault detection; shipboard propulsion drives; Current measurement; Feature extraction; Insulated gate bipolar transistors; Logic gates; Temperature measurement; Vectors; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics Society, IECON 2014 - 40th Annual Conference of the IEEE
Type :
conf
DOI :
10.1109/IECON.2014.7049178
Filename :
7049178
Link To Document :
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