• DocumentCode
    3567423
  • Title

    A simple equivalent model and its improvement for field iterative method [EM wave scattering]

  • Author

    Wang, C.F. ; Gan, Y.B.

  • Author_Institution
    Temasek Labs., Nat. Univ. of Singapore, Singapore
  • Volume
    2
  • fYear
    2003
  • Firstpage
    342
  • Abstract
    The scattering from air inlets/engines significantly affected the overall radar signature of real targets. For this reason, the development of accurate and efficient methods to investigate the electromagnetic scattering from such structures is, therefore, in important task, and has; attracted much attention in the electromagnetics community. One of the well-cited methods for this class of problems is the field iterative method (FIM), first proposed by Reuster and Thiele (IEEE Trans. Antennas Propagat., vol.43, p.286-290, 1995) to compute the scattered electric fields at the aperture of an electrically large perfectly conducting cavity. In order to improve the accuracy of the field iterative method based on the simple equivalent model, an improved field iterative method has been proposed, which can be considered as a relaxation version of the field iterative method. Numerical simulations for scattering from cavities verify the present formulation of the field iterative method, and show that the improved field iterative method is accurate and robust.
  • Keywords
    computational electromagnetics; electric field integral equations; electromagnetic wave scattering; iterative methods; magnetic field integral equations; EFIE; FIM; MFIE; air inlet scattering; electromagnetic scattering; engine scattering; field iterative method; perfectly conducting cavity aperture; scattered electric fields; target radar signature; Apertures; Current density; Electromagnetic scattering; Engines; Integral equations; Iterative methods; Laboratories; Magnetic fields; Radar scattering; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2003. IEEE
  • Print_ISBN
    0-7803-7846-6
  • Type

    conf

  • DOI
    10.1109/APS.2003.1219247
  • Filename
    1219247