Title :
Is there a correlation between ESD qualification values and the voltages measured in the field?
Author :
Gaertner, Reinhold ; Stadler, Wolfgang
Author_Institution :
Infineon Technol. AG, Munich, Germany
Abstract :
Nearly all semiconductor devices are stressed according Human Body Model (HBM) and Charged Device Model (CDM) during qualification with a defined current pulse. People in the manufacturing environment are measuring electrostatic voltages on operators, devices, boards or system and try to correlate these values with the robustness values in the datasheets. The paper describes whether this is possible and illustrates the statements with some case studies. The paper also highlights that there are still some field problems that cannot be reproduced with these device qualification test methods.
Keywords :
electrostatic discharge; semiconductor device models; CDM; ESD qualification values; HBM; charged device model; datasheets; device qualification test methods; electrostatic voltage measurement; human body model; semiconductor devices; Discharges (electric); Electrostatic discharges; Integrated circuit modeling; Qualifications; Standards; Testing; Voltage measurement;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
Print_ISBN :
978-1-4673-1467-1