• DocumentCode
    3567685
  • Title

    ESD risk evaluation of automatic semiconductor process equipment — A new guideline of the German ESD Forum e.V.

  • Author

    Jacob, Ponnu ; Gartner, Richard ; Gieser, H. ; Helling, K. ; Pfeifle, R. ; Thiemann, U. ; Wulfert, F. ; Rothkirch, W.

  • Author_Institution
    Dept. 173 Electron./ Metrol., Empa Dubendorf, Dubendorf, Switzerland
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    While existing standards and guidelines mainly deal with standard requirements for EPAs and ESD-protected workplaces, only few recommendations exist for machines. Increasing ESD-requirements of new semiconductor products requested to provide useful information for machine manufacturers and ESD coordinators as well. The German ESD Forum e.V. developed new guidelines based on practical experience of experts and theoretical considerations on charging and discharging mechanisms as well.
  • Keywords
    electrostatic discharge; risk analysis; semiconductor technology; EPA; ESD coordinators; ESD protected area; ESD risk evaluation; German ESD forum e.V; automatic semiconductor process equipment; semiconductor products; Capacitance; Discharges (electric); Electrostatic discharges; Guidelines; Metals; Surface discharges; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2012 34th
  • ISSN
    0739-5159
  • Print_ISBN
    978-1-4673-1467-1
  • Type

    conf

  • Filename
    6333308