DocumentCode :
3567733
Title :
High reliability/supply chain risks
Author :
Marrujo, Daniel
Author_Institution :
Defense Microelectronics Activity upply Chain Risks
fYear :
2014
Firstpage :
20
Lastpage :
20
Abstract :
Reliability issues associated with the Hubble Space Telescope and current supply chain risks provide a snapshot in to the challenges the government currently faces. As the open literature provides more in sight into the techniques of creating functional devices with undetectable defects, reliability evaluations provide insight into this threat space. The demand for cheaper electronics continues to grow and validation for these devices is being minimized due to resource limitations within the government. There are technologies available to solve some of the supply chain problems but each has its own limitations. The presentation will provide an overview of the security complexity and emerging issues in semi conductor hardware which look to leverage the exciting work this community provides.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
Print_ISBN :
978-1-4799-7308-8
Type :
conf
DOI :
10.1109/IIRW.2014.7049498
Filename :
7049498
Link To Document :
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