DocumentCode
3567733
Title
High reliability/supply chain risks
Author
Marrujo, Daniel
Author_Institution
Defense Microelectronics Activity upply Chain Risks
fYear
2014
Firstpage
20
Lastpage
20
Abstract
Reliability issues associated with the Hubble Space Telescope and current supply chain risks provide a snapshot in to the challenges the government currently faces. As the open literature provides more in sight into the techniques of creating functional devices with undetectable defects, reliability evaluations provide insight into this threat space. The demand for cheaper electronics continues to grow and validation for these devices is being minimized due to resource limitations within the government. There are technologies available to solve some of the supply chain problems but each has its own limitations. The presentation will provide an overview of the security complexity and emerging issues in semi conductor hardware which look to leverage the exciting work this community provides.
fLanguage
English
Publisher
ieee
Conference_Titel
Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
Print_ISBN
978-1-4799-7308-8
Type
conf
DOI
10.1109/IIRW.2014.7049498
Filename
7049498
Link To Document