• DocumentCode
    3567733
  • Title

    High reliability/supply chain risks

  • Author

    Marrujo, Daniel

  • Author_Institution
    Defense Microelectronics Activity upply Chain Risks
  • fYear
    2014
  • Firstpage
    20
  • Lastpage
    20
  • Abstract
    Reliability issues associated with the Hubble Space Telescope and current supply chain risks provide a snapshot in to the challenges the government currently faces. As the open literature provides more in sight into the techniques of creating functional devices with undetectable defects, reliability evaluations provide insight into this threat space. The demand for cheaper electronics continues to grow and validation for these devices is being minimized due to resource limitations within the government. There are technologies available to solve some of the supply chain problems but each has its own limitations. The presentation will provide an overview of the security complexity and emerging issues in semi conductor hardware which look to leverage the exciting work this community provides.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
  • Print_ISBN
    978-1-4799-7308-8
  • Type

    conf

  • DOI
    10.1109/IIRW.2014.7049498
  • Filename
    7049498