Title :
Rapid reliability testing discussion session
Abstract :
Presents the opening page to the panel discussion.
Keywords :
Degradation; Dielectrics; Electric breakdown; Mobile communication; Reliability; Stress; Testing;
Conference_Titel :
Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
Print_ISBN :
978-1-4799-7308-8
DOI :
10.1109/IIRW.2014.7049543
