• DocumentCode
    3567777
  • Title

    Rapid reliability testing discussion session

  • Author

    McPherson, Joe

  • fYear
    2014
  • Firstpage
    167
  • Lastpage
    168
  • Abstract
    Presents the opening page to the panel discussion.
  • Keywords
    Degradation; Dielectrics; Electric breakdown; Mobile communication; Reliability; Stress; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
  • Print_ISBN
    978-1-4799-7308-8
  • Type

    conf

  • DOI
    10.1109/IIRW.2014.7049543
  • Filename
    7049543
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3567777