DocumentCode :
3567781
Title :
Special interest group II: Consumer electronics into Harsh environment electronics: Semiconductor reliability challenges, research needs and started activities
Author :
Aal, Andreas
Author_Institution :
Volkswagen AG, Electronic Analysis / Robustness (EEIP/1), Berliner Ring 2, 38436 Wolfsburg, Germany
fYear :
2014
Firstpage :
177
Lastpage :
178
Abstract :
The topic of this special interest group has its roots in two general segments.
Keywords :
Automotive engineering; Data models; Foundries; Industries; Qualifications; Reliability; Vehicles;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International
Print_ISBN :
978-1-4799-7308-8
Type :
conf
DOI :
10.1109/IIRW.2014.7049547
Filename :
7049547
Link To Document :
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