Title :
Efficient Test Vectors For ISCAS Sequential Benchmark Circuits
Author :
Lee, S.Y. ; Saluja, Krishan Kumar
Author_Institution :
University of Wisconsin
Keywords :
Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Iterative algorithms; Logic circuits; Sequential analysis; Sequential circuits; System testing;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
