DocumentCode
3568305
Title
Efficient Test Vectors For ISCAS Sequential Benchmark Circuits
Author
Lee, S.Y. ; Saluja, Krishan Kumar
Author_Institution
University of Wisconsin
fYear
1993
Firstpage
1511
Lastpage
1514
Keywords
Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit testing; Iterative algorithms; Logic circuits; Sequential analysis; Sequential circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN
0-7803-1281-3
Type
conf
Filename
692945
Link To Document