Title :
Functional Test Pattern Generation For Asynchronous Circuits
Author :
Yau-Hwang Kuo ; Bin-Da Liu
Keywords :
Asynchronous circuits; Binary decision diagrams; Circuit faults; Circuit testing; Disk drives; Logic circuits; Machine vision; Signal generators; Test pattern generators; Very large scale integration;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
