Title :
Functional Testing And Constrained Synthesis Of Sequential Architectures
Author :
Buonanno, G. ; Fummi, F. ; Sciuto, Donatella
Author_Institution :
Politecnico di Milano
Keywords :
Automata; Benchmark testing; Concatenated codes; Constraint optimization; Sequential analysis; Tail; Test pattern generators;
Conference_Titel :
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN :
0-7803-1281-3
