DocumentCode :
3568626
Title :
Extended event-driven modeling of a ΣΔ-fractional-N PLL including non-ideal effects
Author :
Hangmann, Christian ; Hedayat, Christian ; Hilleringmann, Ulrich
Author_Institution :
Sensor Technol. Group, Univ. of Paderborn, Paderborn, Germany
fYear :
2014
Firstpage :
100
Lastpage :
103
Abstract :
In modern systems PLLs are widely used e.g. for frequency synthesis. Since this feedback control system exhibits a mixed-signal nature, it is challenging to use general theory to characterize its dynamic behavior. Additionally, due to the low and high frequency parts, simulations utilizing either a behavioral or transistor-level model are not computer resource efficient. To overcome this the modular and enhanced Event-Driven Model can be used. Since the existing Event-Driven Model is neither applicable to take different divider delays into account nor to consider a ΣΔ-Modulator, this work focuses on the extension of this modeling approach considering a ΣΔ-Fractional-N PLL with non-ideal effects like dead zone, leakage current and different divider delays. This extended model is validated with transistor-level simulations and is used to explore the impact of non-ideal effects on the loop characteristics.
Keywords :
phase locked loops; sigma-delta modulation; ΣΔ-fractional-N PLL; ΣΔ-modulator; dead zone; divider delays; extended event-driven modeling; feedback control system; frequency synthesis; leakage current; mixed-signal nature; transistor-level model; transistor-level simulations; Computational modeling; Delays; Frequency synthesizers; Leakage currents; Phase frequency detector; Phase locked loops; Voltage-controlled oscillators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
Type :
conf
DOI :
10.1109/ICECS.2014.7049931
Filename :
7049931
Link To Document :
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