DocumentCode :
3569094
Title :
Radiation-tolerant standard cell synthesis using double-rail redundant approach
Author :
Ciriani, Valentina ; Frontini, Luca ; Liberali, Valentino ; Shojaii, Seyedruhollah ; Stabile, Alberto ; Trucco, Gabriella
Author_Institution :
Dipt. di Inf., Univ. degli Studi di Milano, Crema, Italy
fYear :
2014
Firstpage :
626
Lastpage :
629
Abstract :
In this paper, we describe a new logic family based on a Double-Rail Redundant Approach, that we call D2RA. Each cell receives both the input bits and their negated values, and is made of two main blocks: the first one produces the output bit, the second one the inverted output bit. When a bit and its negated value have the same logic value, then an error occurred. In such a case, the two output bits are set to the same value. This approach allows to avoid single event effects in presence of radiation. The synthesis of the logic function performed by each cell is based on an algorithm that minimizes the number of transistors in a fully-CMOS design approach. We demonstrate that the proposed approach is correct for any number of input variables, and gives the minimum form with respect to the constraints of the logic model.
Keywords :
CMOS integrated circuits; cellular arrays; integrated circuit design; radiation hardening (electronics); redundancy; D2RA; complementary metal oxide semiconductor; double-rail redundant approach; fully-CMOS design approach; inverted output bit; logic function synthesis; negated value; radiation presence; radiation-tolerant standard cell synthesis; single event effect; CMOS integrated circuits; Circuit faults; Gravity; Logic gates; Single event upsets; Standards; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems (ICECS), 2014 21st IEEE International Conference on
Type :
conf
DOI :
10.1109/ICECS.2014.7050063
Filename :
7050063
Link To Document :
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