• DocumentCode
    3569158
  • Title

    Infrared solder joint inspection on surface mount printed circuit boards

  • Author

    Liu, Roger Z. ; Shi, Y.Q. ; Kosonocky, W.F. ; Higgins, F.P.

  • Author_Institution
    AT&T CommVault Syst., Eatontown, NJ, USA
  • Volume
    1
  • fYear
    1995
  • Firstpage
    145
  • Abstract
    This paper reported some experimental work and the result of applying an infrared inspection system developed in the Machine Vision Laboratory, NJIT to inspect an experimental surface mount solder joint circuit board designed and manufactured by the Machine Vision Group, AT&T Bell Laboratories, Princeton, NJ. The infrared inspection system which consists of a CCD infrared camera, a Datacube image processing system, and a SUN Station is introduced. New features selected for the infrared inspection, the statistical pattern recognition algorithm utilized and the related software are presented as well. It has been demonstrated that infrared imaging technique can identify solder joints of surface mount circuit boards according to their solder volume. The correct classification rate was found to be in the range of 89% to 100%. To our knowledge, the infrared inspection of surface mount PCBs has not been reported in the vision literature
  • Keywords
    automatic optical inspection; infrared imaging; pattern classification; printed circuit manufacture; printed circuit testing; soldering; surface mount technology; CCD infrared camera; Datacube image processing system; SUN Station; classification; infrared imaging; infrared inspection; machine vision; software; solder joints; statistical pattern recognition algorithm; surface mount printed circuit boards; Charge coupled devices; Charge-coupled image sensors; Image processing; Infrared imaging; Inspection; Machine vision; Manufacturing processes; Printed circuits; Pulp manufacturing; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1995., Proceedings., Proceedings of the 38th Midwest Symposium on
  • Print_ISBN
    0-7803-2972-4
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1995.504399
  • Filename
    504399