Title :
Testing of a close spaced thermionic converter
Author :
Luke, J.R. ; Wyant, F.J. ; Eremin, S.A.
Author_Institution :
New Mexico Eng. Res. Inst., New Mexico Univ., Albuquerque, NM, USA
Abstract :
A close-spaced thermionic converter was recently tested at the New Mexico Engineering Research Institute, USA. The converter operates in the Knudsen mode with an interelectrode gap of 5 μm at operating conditions (1400 K emitter temperature and 800 K collector temperature). Direct measurements of such a small gap in an operating thermionic converter have not been reported previously. The gap was measured by directing a laser beam through the interelectrode gap, which produced a diffraction pattern whose width is a function of the gap width. The interelectrode gap was measured for emitter temperatures ranging from 500 K to 1400 K. The measured value at 500 K was 250 μm, and the interelectrode gap decreased with increasing emitter temperature up to 5 μm at 1400 K. In this test of the prototype close-spaced converter, the emitter and collector became electrically shorted whenever the gap was less than 10 μm. This short made it impossible to obtain I-V performance data from the converter. Post test disassembly revealed that the short was due to a foreign particle embedded in the collector surface. A new converter is under construction, and will be tested in the near future
Keywords :
electric current measurement; electrodes; light diffraction; measurement by laser beam; testing; thermionic conversion; voltage measurement; I-V performance data; Knudsen mode operation; USA; close-spaced thermionic converter testing; collector shorting; diffraction pattern; emitter shorting; emitter temperature; interelectrode gap; laser beam measurement; operating conditions; post test disassembly; Diffraction; Electric variables measurement; Laser beams; Laser modes; Prototypes; Structural beams; Surface emitting lasers; Temperature distribution; Temperature measurement; Testing;
Conference_Titel :
Energy Conversion Engineering Conference and Exhibit, 2000. (IECEC) 35th Intersociety
Conference_Location :
Las Vegas, NV
Print_ISBN :
1-56347-375-5
DOI :
10.1109/IECEC.2000.870698