DocumentCode
3569216
Title
An universal BIST methodology for interconnects
Author
ChauChin Su
fYear
1993
Firstpage
1615
Lastpage
1618
Keywords
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design methodology; Hardware; Integrated circuit interconnections; Legged locomotion; Pins; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN
0-7803-1281-3
Type
conf
Filename
692973
Link To Document