Title :
RRAM-based 7T1R nonvolatile SRAM with 2x reduction in store energy and 94x reduction in restore energy for frequent-off instant-on applications
Author :
Lee, Albert ; Meng-Fan Chang ; Chien-Chen Lin ; Chien-Fu Chen ; Mon-Shu Ho ; Chia-Chen Kuo ; Pei-Ling Tseng ; Shyh-Shyuan Sheu ; Tzu-Kun Ku
Author_Institution :
Nat. Tsing Hua Univ., Hsinchu, Taiwan
Abstract :
This study proposes a 7T1R nonvolatile SRAM (nvSRAM) to 1) reduce store energy by using a single NVM device, 2) suppress DC-short current during restore operations through the use of a pulsed-overwrite (POW) scheme, and 3) achieves high restore yield by using a differentially supplied initialization (DSI) scheme. This initialization-and-overwrite (IOW) 7T1R nvSRAM improves breakeven-time (BET) by 6+x, compared to previous nvSRAMs. We fabricated a 16Kb IOW-7T1R nvSRAM using HfOx RRAM and a 90nm process. This represents the first ever silicon verified single-NVM nvSRAM macro. Measurements obtained in test-mode confirm that the proposed nvSRAM reduces store energy by 2x and restore energy by 94x, compared to 2R-based nvSRAMs.
Keywords :
SRAM chips; elemental semiconductors; logic testing; low-power electronics; resistive RAM; silicon; 2R-based nvSRAM; 7T1R nonvolatile SRAM; BET; DC-short current; DSI scheme; IOW 7T1R nvSRAM; NVM device; POW scheme; RRAM; Si; breakeven-time; differentially supplied initialization scheme; frequent-off instant-on applications; initialization-and-overwrite; pulsed-overwrite scheme; restore energy; silicon; single nvSRAM macro; Energy measurement; Hafnium compounds; Nonvolatile memory; Random access memory; Sensors; Silicon; Switches;
Conference_Titel :
VLSI Technology (VLSI Technology), 2015 Symposium on
DOI :
10.1109/VLSIT.2015.7223641