DocumentCode
3569469
Title
Optimizing Test Data Volume Using Hybrid Compression
Author
Keller, Brion ; Bhatia, Sandeep ; Bartenstein, Thomas ; Foutz, Brian ; Uzzaman, Anis
fYear
2008
Firstpage
157
Lastpage
162
Abstract
This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests while achieving ultimate output compression using MISRs for the majority of tests. By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support volume diagnostics.
Keywords
data compression; logic testing; system-on-chip; MISR; XOR; hybrid compression; multiple input signature register; system-on-chip; test data volume; Automatic test pattern generation; Circuit testing; Costs; Design optimization; Digital circuits; Error analysis; Logic testing; Performance evaluation; Software testing; System testing; OPMISR+; Test Data Compression; XOR;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2008. ATS '08. 17th
ISSN
1081-7735
Print_ISBN
978-0-7695-3396-4
Type
conf
DOI
10.1109/ATS.2008.78
Filename
4711576
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