Title :
Optimizing Test Data Volume Using Hybrid Compression
Author :
Keller, Brion ; Bhatia, Sandeep ; Bartenstein, Thomas ; Foutz, Brian ; Uzzaman, Anis
Abstract :
This paper describes a simple means to enable direct diagnosis by bypassing MISRs on a small set of tests while achieving ultimate output compression using MISRs for the majority of tests. By combining two compression schemes, XOR and MISRs in the same device, it becomes possible to have high compression and still support volume diagnostics.
Keywords :
data compression; logic testing; system-on-chip; MISR; XOR; hybrid compression; multiple input signature register; system-on-chip; test data volume; Automatic test pattern generation; Circuit testing; Costs; Design optimization; Digital circuits; Error analysis; Logic testing; Performance evaluation; Software testing; System testing; OPMISR+; Test Data Compression; XOR;
Conference_Titel :
Asian Test Symposium, 2008. ATS '08. 17th
Print_ISBN :
978-0-7695-3396-4
DOI :
10.1109/ATS.2008.78
