• DocumentCode
    3569474
  • Title

    Cost Efficient Methods to Improve Performance of Broadcast Scan

  • Author

    Wang, Seongmoon ; Wei, Wenlong

  • Author_Institution
    NEC Labs. America, Princeton, NJ
  • fYear
    2008
  • Firstpage
    163
  • Lastpage
    169
  • Abstract
    This paper presents techniques to improve compressions by improving fault coverage that can be achieved by broadcast scan. Due to reconvergent gates that artificially occur in broadcast scan, broadcast scan fault coverage is often much lower than standard serial scan fault coverage. The proposed scan chain reordering technique improves broadcast scan fault coverage by minimizing the number of reconvergent gates and hence no or very small number of test patterns are required to be applied by standard serial scan to detect faults undetected by broadcast scan. This increases the overall compression ratio. To eliminate or minimize increase in routing overhead, the distance that each scan cell can be relocated by the scan chain reordering procedure is limited. Test points are inserted to further reduce correlation among outputs of scancells. The proposed scan chain reordering technique improved broadcast scan fault converge by up to 8.5%. Large fault coverage improvement was achieved by the proposed method, especially for circuits that suffer low broadcast scan fault coverage. Broadcast scan fault coverage for the largest two industrial designs was even higher than standard serial scan fault coverage.
  • Keywords
    automatic test equipment; failure analysis; integrated circuit testing; logic testing; automatic test equipments; broadcast scan fault coverage; input test data compression; reconvergent gates; scan chain reordering; test point insertion; Automatic test pattern generation; Automatic testing; Broadcasting; Circuit faults; Circuit testing; Costs; Fault detection; National electric code; Test data compression; Test pattern generators; Broadcast Scan; Input Test Data Compression; Scan Chain Reordering; Test Point Insertion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2008. ATS '08. 17th
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-3396-4
  • Type

    conf

  • DOI
    10.1109/ATS.2008.72
  • Filename
    4711577