Title :
Time-domain vector-potential analysis of complex RF multilayer structures via segmentation technique
Author :
Georgieva, N. ; Zhizhang Chen ; Oberhammer, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Dalhousie Univ., Halifax, NS, Canada
Abstract :
The newly developed time-domain vector potential (TDVP) approach, based on the finite-difference solution of the wave equation for the magnetic vector potential A/spl I.oarr/, is applied to the analysis of multilayer structures typical for RF/microwave printed-circuit boards (PCB), widely used in the personal communication systems (PCS) technology. The transient analysis of complex multiport discontinuities, where cross-talk and resonant phenomena occur, is used to obtain their scattering parameters. The subsequent modeling of the whole unit is carried out by making use of the S-parameter library, prepared by the TDVP algorithm, and, a suitable microwave-circuit simulator, e.g. EESof Touchstone and Libra. The TDVP algorithm is also used to predict the resonant frequencies of patch cavities which are encountered in multilevel multiconductor structures.
Keywords :
S-parameters; UHF circuits; electromagnetic fields; electronic engineering computing; microstrip circuits; microwave circuits; printed circuits; time-domain analysis; transient analysis; EESof Touchstone; Libra; RF PCB; S-parameter library; TDVP algorithm; complex RF multilayer structures; finite-difference solution; magnetic vector potential; microwave PCB; microwave-circuit simulator; multilevel multiconductor structures; multiport discontinuities; patch cavities; printed circuit boards; resonant frequencies; scattering parameters; segmentation technique; time-domain vector-potential analysis; transient analysis; wave equation; Finite difference methods; Magnetic analysis; Magnetic multilayers; Magnetic resonance; Nonhomogeneous media; Partial differential equations; Personal communication networks; Radio frequency; Scattering parameters; Time domain analysis;
Conference_Titel :
Microwave Symposium Digest, 1998 IEEE MTT-S International
Print_ISBN :
0-7803-4471-5
DOI :
10.1109/MWSYM.1998.705038