• DocumentCode
    35696
  • Title

    High-Frequency Gate-All-Around Vertical InAs Nanowire MOSFETs on Si Substrates

  • Author

    Johansson, Sofia ; Memisevic, Elvedin ; Wernersson, Lars-Erik ; Lind, Erik

  • Author_Institution
    Dept. of Electr. & Inf. Technol., Lund Univ., Lund, Sweden
  • Volume
    35
  • Issue
    5
  • fYear
    2014
  • fDate
    May-14
  • Firstpage
    518
  • Lastpage
    520
  • Abstract
    We demonstrate a vertical InAs nanowire MOSFET integrated on Si substrate with an extrinsic peak cut-off frequency of 103 GHz and a maximum oscillation frequency of 155 GHz. The transistor has a transconductance of 730 mS/mm and is based on arrays of nanowires with gate-all-around and high-κ gate dielectric. Furthermore, small-signal modeling shows a ~80% reduction of the total parasitic gate capacitance when the metal pad overlap in the transistors is reduced through additional patterning.
  • Keywords
    III-V semiconductors; MOSFET; indium compounds; nanowires; silicon; wide band gap semiconductors; InAs; Si; frequency 155 GHz; high-κ gate dielectric; high-frequency gate-all-around vertical nanowire MOSFET; small-signal modeling; total parasitic gate capacitance; Capacitance; Logic gates; MOSFET; Radio frequency; Resistance; Substrates; III-V; III??V; InAs; InAs.; MOSFET; Nanowire; RF; transistor;
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2014.2310119
  • Filename
    6767079