• DocumentCode
    356967
  • Title

    Sensitivity of performance and degradation measurements on AMTEC electrodes in sodium exposure test cells to experiment conditions

  • Author

    Schuller, Michael ; Fiebig, Brad ; Hudson, Patricia ; Williams, Alicia

  • Author_Institution
    Center for Space Power, Texas A&M Univ., College Station, TX, USA
  • Volume
    1
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    704
  • Abstract
    In this paper we discuss performance and degradation measurements made on AMTEC electrodes in sodium exposure test cells. We measured electrode temperatures, sodium pool temperatures, and apparent charge transfer resistance values, from which we derived normalized exchange current density (B) values for WRh, MoRe, Re, and Ir electrodes. Electrode temperatures ranged from 600°C to 900°C, while sodium pool temperatures ranged from 190°C to 340°C. In general, the B values for WRh, MoRe, and Re samples were in the same range, while the B values for Ir were lower. B values generally increased linearly with increasing sodium pool temperature
  • Keywords
    charge exchange; current density; electrodes; iridium; molybdenum alloys; rhenium; rhenium alloys; rhodium alloys; sodium; thermoelectric conversion; thermoelectric devices; tungsten alloys; 100 to 340 C; 600 to 900 C; AMTEC electrodes; Ir; Ir electrodes; MoRe; MoRe electrodes; Re; Re electrodes; WRh; WRh electrodes; apparent charge transfer resistance values; degradation measurements; electrode temperatures; normalized exchange current density values; performance measurement; sodium exposure test cells; Charge measurement; Current measurement; Degradation; Density measurement; Electrical resistance measurement; Electrodes; Temperature distribution; Temperature measurement; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Energy Conversion Engineering Conference and Exhibit, 2000. (IECEC) 35th Intersociety
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    1-56347-375-5
  • Type

    conf

  • DOI
    10.1109/IECEC.2000.870856
  • Filename
    870856