• DocumentCode
    357016
  • Title

    A study on subjective evaluation of facial polygon model

  • Author

    Kase, Daisuke ; Hamamoto, Takayuki ; Hangai, Seiichiro

  • Author_Institution
    Dept. of Electr. Eng., Sci. Univ. of Tokyo, Japan
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    611
  • Abstract
    In order to improve drawing speed without degrading image quality in computer graphics, reduction of the number of polygons that are difficult to detect subjectively is preferable. In particular, the number of vertices of an actual facial image is huge and the reduction of these vertices without subjective degradation is strongly needed. However, the way one deletes vertices uses evaluation functions such as surface area difference, volume difference, and so on. We have developed an interactive presentation system for evaluating 3D-polygon models. The system enables an evaluator to rotate both the original and reduced polygon models in any direction simultaneously, and it gives a mean opinion score. In an experiment, 6 reduced polygon models (the number of polygons being reduced 80%, 60%, 40%, 20%, 10% and 5%) using 6 evaluation functions are evaluated on the system. From the results, the vertex removal method minimizing the change of surface area shows good scores for all the reduced models
  • Keywords
    computational geometry; computer graphics; 3D-polygon models; change of surface area; computer graphics; evaluation functions; facial image; facial polygon model; image quality; interactive presentation system; mean opinion score; reduced polygon models; subjective degradation; subjective evaluation; surface area difference; vertex removal method; volume difference; Cameras; Character generation; Computer graphics; Degradation; Engineering drawings; Humans; Image quality; Monitoring; Rendering (computer graphics); System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2000. ICME 2000. 2000 IEEE International Conference on
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7803-6536-4
  • Type

    conf

  • DOI
    10.1109/ICME.2000.871437
  • Filename
    871437