DocumentCode
3570410
Title
A systematic approach of statistical modeling and its application to CMOS circuits
Author
Styblinski, M.A.
fYear
1993
Firstpage
1805
Lastpage
1808
Keywords
Circuit simulation; Circuit synthesis; Fabrics; Integrated circuit modeling; Minimization methods; Principal component analysis; Production; Scattering parameters; Semiconductor device modeling; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1993., ISCAS '93, 1993 IEEE International Symposium on
Print_ISBN
0-7803-1281-3
Type
conf
Filename
693021
Link To Document