• DocumentCode
    357112
  • Title

    Automatic image event segmentation and quality screening for albuming applications

  • Author

    Loui, Alexander C. ; Savakis, Andreas E.

  • Author_Institution
    Imaging Sci. & Technol. Lab., Eastman Kodak Co., Rochester, NY, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1125
  • Abstract
    In this paper, a system for automatic albuming of consumer photographs is described and its specific core components of event segmentation and screening of low quality images are discussed. A novel event segmentation algorithm was created to automatically cluster pictures into events and sub-events for albuming, based on date/time meta data information as well as color content of the pictures. A new quality-screening is developed based on object quality to detect problematic images due to underexposure, low contrast, and camera defocus or movement. Performance testing of these algorithms was conducted using a database of real consumer photos and showed that these functions provide a useful first-cut album layout for typical rolls of consumer pictures. A first version of the automatic albuming application software was rested through a consumer trial in the United States from August to December 1999
  • Keywords
    image colour analysis; image segmentation; meta data; multimedia databases; visual databases; automatic albuming system; automatic image event segmentation; automatic picture clustering; color content; consumer photographs; date/time metadata information; events; first-cut album layout; object quality; performance testing; photo database; problematic image detection; quality screening; sub-events; Application software; Automatic testing; Clustering algorithms; Digital cameras; Image databases; Image segmentation; Internet; Laboratories; Object detection; Software testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2000. ICME 2000. 2000 IEEE International Conference on
  • Conference_Location
    New York, NY
  • Print_ISBN
    0-7803-6536-4
  • Type

    conf

  • DOI
    10.1109/ICME.2000.871558
  • Filename
    871558