Title :
Sensitivity analysis of the cross-talk in microstrip transmission lines
Author :
Rajan, V. S Prasanna ; Raju, K.C.James
Author_Institution :
Sch. of Phys., Hyderabad Univ., India
Abstract :
This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted. Based on the calculations and resulting figures, conclusions are drawn for minimizing the cross-talk. The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed.
Keywords :
VLSI; crosstalk; integrated circuit interconnections; microstrip lines; permittivity; sensitivity analysis; waveguide theory; VLSI systems; cross-talk minimization; dielectric constant; dimensional parameters; interconnects; microstrip transmission lines; normalized inter-layer cross-talk voltage; sensitivity analysis; sensitivity curves; substrate; unbalanced cross-talk voltage; Conductors; Dielectric substrates; Distributed parameter circuits; Integrated circuit interconnections; Microstrip; Sensitivity analysis; Strips; Transmission line theory; Transmission lines; Very large scale integration;
Conference_Titel :
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN :
81-900652-0-3
DOI :
10.1109/ICEMIC.1999.871613