• DocumentCode
    357150
  • Title

    Sensitivity analysis of the cross-talk in microstrip transmission lines

  • Author

    Rajan, V. S Prasanna ; Raju, K.C.James

  • Author_Institution
    Sch. of Phys., Hyderabad Univ., India
  • fYear
    1999
  • fDate
    6-8 Dec. 1999
  • Firstpage
    129
  • Lastpage
    132
  • Abstract
    This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted. Based on the calculations and resulting figures, conclusions are drawn for minimizing the cross-talk. The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed.
  • Keywords
    VLSI; crosstalk; integrated circuit interconnections; microstrip lines; permittivity; sensitivity analysis; waveguide theory; VLSI systems; cross-talk minimization; dielectric constant; dimensional parameters; interconnects; microstrip transmission lines; normalized inter-layer cross-talk voltage; sensitivity analysis; sensitivity curves; substrate; unbalanced cross-talk voltage; Conductors; Dielectric substrates; Distributed parameter circuits; Integrated circuit interconnections; Microstrip; Sensitivity analysis; Strips; Transmission line theory; Transmission lines; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
  • Print_ISBN
    81-900652-0-3
  • Type

    conf

  • DOI
    10.1109/ICEMIC.1999.871613
  • Filename
    871613