Title :
Ultra-short pulse meter of current-voltage and capacitance-voltage characteristics for Ni LabVIEW
Author_Institution :
Tomsk State Univ. of Control Syst. & Radioelectron., Tomsk, Russia
Abstract :
The peculiarities of practical realization of the method, that provides measurement of the current-voltage and capacitance-voltage characteristics by ultra-short pulses, are considered.
Keywords :
capacitance measurement; electric current measurement; nickel; virtual instrumentation; voltage measurement; LabVIEW; Ni; capacitance-voltage measurement characteristics; current-voltage measurement characteristics; ultra-short pulse meter; Capacitance-voltage characteristics; Current measurement; Integrated circuits; Optical pulse generation; Pulse measurements; Semiconductor device measurement; Software;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Print_ISBN :
978-1-4673-1199-1
