Title :
Advanced technologies and their impact on EMC standardization and EMC measurement techniques
Author_Institution :
Rohde & Schwarz, Munchen, Germany
Abstract :
New technologies in combination with the demand from the market will affect future work in EMC standardization, test concepts as well as the development of new EMC test instrumentation and systems. Trends can already be recognized. The paper describes the market demands, technology trends in different product areas and current changes in EMC standardization. Some of the requirements for new EMC measurement techniques are derived from this consideration.
Keywords :
electromagnetic compatibility; standardisation; EMC measurement; EMC standardization; test instrumentation; Aerospace electronics; Consumer electronics; Consumer products; Electromagnetic compatibility; Immune system; Immunity testing; Measurement techniques; Standardization; System testing; Test equipment;
Conference_Titel :
Electromagnetic Interference and Compatibility '99. Proceedings of the International Conference on
Print_ISBN :
81-900652-0-3
DOI :
10.1109/ICEMIC.1999.871636
