• DocumentCode
    3571760
  • Title

    Getting Closer to True CMOS-Circuits in a 4 M-DRAM

  • Author

    Pribyl, W. ; B?¤hring, M. ; Sommer, D. ; Smith, S.

  • Author_Institution
    SIEMENS AG - COMPONENTS GROUP, Otto Hahn Ring 6, D-8000 M?ƒ??nchen 83
  • fYear
    1987
  • Firstpage
    65
  • Lastpage
    68
  • Abstract
    NMOS-type circuits in different areas of CMOS-DRAMs are discussed and new concepts using true CMOS circuitry are presented. The second part of the paper describes a 4 Megabit DRAM, which utilizes some of the new concepts. It was fabricated in a submicron, triple poly single metal CMOS technology with a trench capacitor and a Fully Overlapping BItline Contact (FOBIC). RAS access times of 70 ns are achieved with a power consumption of 350 mW (5mW standby).
  • Keywords
    CMOS logic circuits; CMOS technology; Capacitors; Circuit testing; Degradation; MOS devices; Random access memory; Stress; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-state Circuits Conference, 1987. ESSCIRC '87. 13th European
  • Print_ISBN
    3800715341
  • Type

    conf

  • Filename
    5434951