• DocumentCode
    3571949
  • Title

    Polarisation dependent scattering loss in thin, shallow-ridge silicon-on-insulator waveguides with resonant lateral leakage

  • Author

    Nguyen, T.G. ; Mitchell, A.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    We present an analysis of the polarisation dependent scattering loss due to surface and sidewall roughness in thin, shallow-ridge silicon-on-insulator (SOT) waveguides using three dimensional coupled mode theory. The impact on resonant lateral leakage is discussed.
  • Keywords
    coupled mode analysis; light polarisation; light scattering; optical losses; optical waveguides; ridge waveguides; silicon-on-insulator; surface roughness; Si-SiO2; polarisation dependent scattering loss; resonant lateral leakage; shallow ridge silicon-on-insulator waveguides; sidewall roughness; surface roughness; three dimensional coupled mode theory; Optical waveguides; Rough surfaces; Scattering; Silicon on insulator technology; Slabs; Surface roughness; Surface waves; Optical waveguides; radiation modes; roughness; scattering loss; silicon on insulator technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optical Fibre Technology (ACOFT), 2010 35th Australian Conference on
  • Type

    conf

  • DOI
    10.1109/ACOFT.2010.5929934
  • Filename
    5929934
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3571949