Title :
The Impact of Very Large Scale Integration (VLSI) on Systems and People
Author_Institution :
IBM Laboratory, Boeblingen/Germany
Keywords :
Calculators; Circuit testing; Cost function; Hardware; Integrated circuit technology; Laboratories; Large scale integration; Power system reliability; Silicon; Very large scale integration;
Conference_Titel :
Solid State Circuits Conference, 1977. ESSCIRC '77. 3rd European