DocumentCode :
3572265
Title :
SiCGe Ternarv Allovs - Extending Si-based Heterostructures
Author :
Iyer, S.S. ; Eberl, K. ; Powell, A.R. ; Ek, B.A.
Author_Institution :
IBM Research Division, T.J. Watson Research Center Yorktown Heights, New York 10598
fYear :
1992
Firstpage :
351
Lastpage :
354
Abstract :
We have synthesized Si1-y Cyand Si1-x-yCyGexalloys using Molecular Beam Epitaxy. When combined with the Si-Ge system. the new ternary system offers greater versatility and freedom in strain and bandgap engineering. Unlike the Si-Ge system the Si-C system has a high misfit (52%) and low solubility (≪ 10-6), with a propensity to compound formation, therefore. the structures are kinetically stabilized by low temperature growth. In this paper. we first describe bandgap engineering applied to this system. We then consider the growth methodology and critical thickness. Strain compensation and strain engineering using the ternary system is then described. Finally we show that thermal degradation of these films does not occur till ≫ 800°C first by interdiffusion and subsequently at higher temperatures by silicon carbide precipitation.
Keywords :
Capacitive sensors; Epitaxial growth; Germanium alloys; Germanium silicon alloys; Lattices; Molecular beam epitaxial growth; Photonic band gap; Silicon alloys; Silicon carbide; Silicon germanium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Print_ISBN :
444894780
Type :
conf
Filename :
5435116
Link To Document :
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