DocumentCode :
3572436
Title :
Limitations of Electrical Interconnections in Electronic Systems
Author :
Noll, T.G.
Author_Institution :
Corporate Research and Development, SIEMENS AG, Munich F.R.G.
fYear :
1992
Firstpage :
561
Lastpage :
561
Keywords :
Bandwidth; Delay effects; Electronics packaging; Geometry; Integrated circuit interconnections; Lead compounds; Microelectronics; Research and development; Semiconductor device reliability; Wiring;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Print_ISBN :
444894780
Type :
conf
Filename :
5435160
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=3572436
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