Title :
Influence of Excitonic Scattering on Charge Carrier Ambipolar Diffusion in Silicon
Author :
Velmre, Enn ; Udal, Andres
Author_Institution :
Tallinn Technical University, Estonia
Keywords :
Charge carrier density; Charge carrier processes; Charge carriers; Current density; Electron mobility; Excitons; Impurities; Light scattering; Particle scattering; Silicon;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194403