Title :
Technology of the Diode Programmable Read Only Memory
Author :
Lifka, H. ; Woerlee, P.H. ; de Graaf, C. ; Hart, C.M. ; Janssen, P.J.M. ; Paulzen, G.M. ; Theunissen, M.J.J. ; de Vreede, P.W.H.
Author_Institution :
Philips Research Laboratories, The Netherlands
Keywords :
Diodes; Electric breakdown; Isolation technology; Laboratories; MOS devices; MOSFETs; PROM; Read only memory; Stress; Voltage;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194418
