Technology of the Diode Programmable Read Only Memory

Author

Lifka, H. ; Woerlee, P.H. ; de Graaf, C. ; Hart, C.M. ; Janssen, P.J.M. ; Paulzen, G.M. ; Theunissen, M.J.J. ; de Vreede, P.W.H.

Author_Institution

Philips Research Laboratories, The Netherlands

fYear

1997

Firstpage

272

Lastpage

275

Keywords

Diodes; Electric breakdown; Isolation technology; Laboratories; MOS devices; MOSFETs; PROM; Read only memory; Stress; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Device Research Conference, 1997. Proceeding of the 27th European

Print_ISBN

2-86332-221-4

Type

DOI

10.1109/ESSDERC.1997.194418

Filename

1503348

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