DocumentCode :
3573386
Title :
Temperature dependence of intermodulation and linearity in GaN based devices
Author :
Ahmed, A. ; Islam, S.S. ; Anwar, A.F.M.
Author_Institution :
Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
Volume :
1
fYear :
2001
Firstpage :
579
Abstract :
The gain and intermodulation distortion of an AlGaN-GaN device operating at RF, have been analyzed using a general Volterra series representation. The circuit model to represent the GaN FET is obtained from a physics based analysis. Theoretical current-voltage characteristics are In excellent agreement with the experimental data. For a 1 /spl mu/m/spl times/500 /spl mu/m Al/sub 0.15/Ga/sub 0.85/N-GaN FET, the calculated output power, power added efficiency and gain are 25 dBm, 13% and 10.1 dB, respectively at 15 dBm input power and are in excellent agreement with the experimental data. The output referred third order intercept point IP3 is 39.9 dBm at 350 K and 33 dBm at 650 K. These are in agreement with the simulated results from Cadence which are 39.34 dBm and 35.7 dBm, respectively. At 10 GHz, third order intermodulation distortion IM3 for 10 dBm output power is -88 dB at 350 K and -82 dB at 650 K. At 350 K IM3 is -97 dB at 5 GHz and -88 dB at 10 GHz. For the same frequencies IM3 increased to -90 dB and -82 dB, respectively, at 650 K.
Keywords :
III-V semiconductors; aluminium compounds; equivalent circuits; gallium compounds; high-temperature electronics; intermodulation distortion; microwave field effect transistors; microwave power transistors; power HEMT; semiconductor device models; wide band gap semiconductors; 1 micron; 350 to 650 K; 5 to 10 GHz; 500 micron; Al/sub 0.15/Ga/sub 0.85/N-GaN; AlGaN-GaN HEMT; GaN based devices; I-V characteristics; SHF; circuit model; current-voltage characteristics; gain; general Volterra series representation; intermodulation distortion; linearity; output power; physics based analysis; power added efficiency; temperature dependence; third order IMD; third order intercept point; Aluminum gallium nitride; Circuits; FETs; Gallium nitride; Intermodulation distortion; Linearity; Physics; Power generation; Radio frequency; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2001 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-6538-0
Type :
conf
DOI :
10.1109/MWSYM.2001.966960
Filename :
966960
Link To Document :
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