DocumentCode
3573681
Title
A New Lateral Insulated Gate Bipolar Transistor Structure with Improved Electrical Characteristics
Author
Vellvehf, M. ; Godignon, P. ; Flores, D. ; Fern??ndez, J. ; Hidalgo, S. ; Rebollo, J. ; Mill??n, J.
Author_Institution
Centro Nacional de Microelectr?nica (CNM-CSIC)., 08193 Bellaterra. Barcelona. Spain. Tel: + 34 3 5802625, Fax: + 34 3 5801496, E-mail: miquel@cnm.es
fYear
1995
Firstpage
639
Lastpage
642
Abstract
This paper is aimed at the experimental demonstration of a new LIGBT structure with enhanced latch-up characteristics for power IC applications. For this purpose, several LIGBTs have been fabricated, which allows the comparison of the electrical characteristics of the proposed structure with those of previously reported LIGBTs. The RESURFed devices show a 360 V breakdown voltage and structures with and without shorted anode have been considered. The proposed modified LIGBT does not exhibit latch-up and shows a good compromise between static and dynamic characteristics.
Keywords
Anodes; Cathodes; Electric resistance; Electric variables; Immune system; Insulated gate bipolar transistors; Insulation; Power integrated circuits; Substrates; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1995. ESSDERC '95. Proceedings of the 25th European
Print_ISBN
286332182X
Type
conf
Filename
5436075
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