DocumentCode :
3574971
Title :
Design of a long range bidirectional MEMS scanner for a tunable 3D integrated Mirau interferometer
Author :
Wei Xu ; Bosseboeuf, Alain ; Parrain, Fabien ; Martincic, Emile
Author_Institution :
Inst. d´Electron. Fondamentale, Univ. Paris Sud, Orsay, France
fYear :
2014
Firstpage :
1
Lastpage :
6
Abstract :
Mirau interferometers are two beam interferometers with coaxial optical beams that are widely used in full-field optical surface profilers. An integrated Mirau interferometer with a MEMS mirror scanner is proposed in this paper. The novelty of the scanner design is the use of self-aligned vertical electrostatic combs made in double SOI wafer technology which allows a large range, bidirectional, and symmetric vertical translation of the reference mirror. Electrostatic and mechanical analytical calculations and Finite Element Modeling simulations were carried out to design and optimize the MEMS scanner. A large bidirectional range (+/-20 μm) motion under 60V applied voltage is achievable. Good flatness of the reference mirror is preserved during motion, what is essential for interferometrie measurements. A fabrication process which minimizes the number of mask levels is proposed. It is based on front and back side Deep Reactive Ion Etching and dry film photoresist lithographic steps.
Keywords :
circuit tuning; finite element analysis; light interferometers; microfabrication; micromechanical devices; micromirrors; photoresists; silicon-on-insulator; sputter etching; MEMS mirror scanner; SOI wafer technology; coaxial optical beam; deep reactive ion etching; dry film photoresist lithographic step; fabrication process; finite element modeling simulation; full-field optical surface profiler; interferometric measurement; long range bidirectional MEMS scanner; microelectromechanical system; self-aligned vertical electrostatic comb; silicon on insulator; tunable 3D integrated Mirau interferometer; two beam interferometer; Electrostatics; Fabrication; Fingers; Micromechanical devices; Optical interferometry; Silicon; Springs; 3D integration; MEMS scanner; Mirau interferometer; vertical combs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS (DTIP), 2014 Symposium on
Print_ISBN :
978-2-35500-028-7
Type :
conf
DOI :
10.1109/DTIP.2014.7056655
Filename :
7056655
Link To Document :
بازگشت