• DocumentCode
    3575642
  • Title

    Characterization of nano-coated micro- and nanostructures by pushing

  • Author

    Liimatainen, Ville ; Venalainen, Janne ; Koverola, Mikko ; Quan Zhou ; Lyytinen, Jussi ; Koskinen, Jari ; Rontu, Ville ; Berdova, Maria ; Franssila, Sami

  • Author_Institution
    Dept. of Electr. Eng. & Autom., Aalto Univ., Aalto, Finland
  • fYear
    2014
  • Firstpage
    23
  • Lastpage
    27
  • Abstract
    In this paper, we present methodology for measuring mechanical properties of nano-coated micro- and nanostructures by pushing. The methods are demonstrated in four applications: interfacial mechanical properties of atomic layer deposited (ALD) thin films, strength of ALD-coated microfibers, adhesion and mechanical properties of thin films, and adhesion between microparts. The measured properties include adhesion between particles and thin films, adhesion between thin films and substrates, strength of fibers, Young´s moduli and residual stresses of thin films, fracture strength of thin films, and wet adhesion between microparts. We show that these properties can be obtained by measuring lateral and normal forces when pushing objects, and discuss how similar methodology can be used in other applications, such as membrane and cell characterization.
  • Keywords
    Young´s modulus; adhesion; atomic layer deposition; force measurement; fracture toughness; internal stresses; microfabrication; nanofabrication; nanostructured materials; thin films; ALD coated microfiber; ALD thin films; Young´s moduli; atomic layer deposition; fracture strength; interfacial mechanical properties; lateral force measurement; mechanical properties measurement; nanocoated microstructure; nanocoated nanostructure; normal force measurement; pushing; residual stress; wet adhesion; Adhesives; Films; Force; Force measurement; Optical fiber sensors; Silicon; Testing; mechanical characterization; microstructures; nano-coatings; nanostructures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014 International Conference on
  • Type

    conf

  • DOI
    10.1109/3M-NANO.2014.7057329
  • Filename
    7057329