DocumentCode :
3575664
Title :
A bi-direction asymmetric fast scanning method
Author :
Yinan Wu ; Yongchun Fang ; Xiao Ren
Author_Institution :
Inst. of Robot. & Autom. Inf. Syst., Nankai Univ., Tianjin, China
fYear :
2014
Firstpage :
171
Lastpage :
176
Abstract :
As a versatile instrument, an atomic force microscopy (AFM) has been widely utilized in many fields. However, when imaging biological samples, the scan area typically covers some unnecessary sub-areas which provide no useful information yet decrease scanning speed. Moreover, traditional scanning method has to include two parts of forward scanning and opposite scanning, where the opposite scanning almost takes the same time as the forward one yet it makes little contribution for the image construction of the sample. To overcome these problems, in this paper, we propose a novel bi-direction asymmetric fast scanning method specifically designed for biological samples, which reduces scanning time vastly and acquires higher-quality imaging for samples. To be specific, we first forward scan a sample quickly to distinguish interested areas from un-interested ones. Based on this part of knowledge, the opposite scanning process is then implemented with varying scanning frequency for distinct areas, with interested areas carefully scanned while uninterested ones skipped through quickly, so as to enhance imaging performance and reduce scanning time. As demonstrated by simulation and experimental results, when compared with the conventional scanning method, the proposed bi-direction asymmetric fast scanning method distributes the scanning time more intelligently, and due to this merit, it provides a more reliable image for biological samples with less scanning time.
Keywords :
atomic force microscopy; biological techniques; atomic force microscopy; bidirection asymmetric fast scanning method; biological samples; forward scanning; Algorithm design and analysis; Biology; Force; Imaging; Probes; Surface topography; atomic force microscopy; height information; high speed scan; slope; the forward scanning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014 International Conference on
Type :
conf
DOI :
10.1109/3M-NANO.2014.7057340
Filename :
7057340
Link To Document :
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