DocumentCode
3575678
Title
Ion beam nanofabrication for mass production of nanotweezers based on new composite functional material with shape memory
Author
Koledov, V. ; Shavrov, V. ; Jede, R. ; von Gratowski, S. ; Irzhak, A. ; Shelyakov, A.
Author_Institution
Kotelnikov Inst. of Radioeng. & Electron., Moscow, Russia
fYear
2014
Firstpage
321
Lastpage
325
Abstract
Miniaturization is the central theme in modern fabrication technology. Many of the components used in modern products are becoming smaller and smaller. The applicability of the standard lithographic technologies to processing the new functional materials is crucial for their successful wide implementation in practice. Recently we have reported experimental design and test of the new generation for nano-mecanical devices like nano-tweezers based on original bilayer Ti2NiCu/Pt composite structures. In the present paper it is demonstrated that standard ion beam nano-fabrication technology is quit suitable for full cycle of production operational stages of practical nano-tweezers production. The technological experiments were done on realizing by usage of a novel focused ion beam instrument Raith ionLiNE™ device. This device is a novel focused ion beam instrument for low dose nanolithography and nano-fabrication. ionLiNE™ Raith was applied for experimental composite nano-tweezers production on the base of Ti2NiCu/W with length - 30 μm, gap width 0.9 μ. The tests showed high quality of reproduction and long term operation under thermal control at temperature change only 14 K.
Keywords
composite materials; nanofabrication; nanolithography; shape memory effects; composite functional material; ion beam nanofabrication; ionLiNE Raith; lithographic technology; miniaturization; nanotweezer mass production; shape memory; Abstracts; Conferences; Manufacturing; Nanoscale devices; composite functional material; focus ion beam milling; focused ion beam; ion beam lithography; ion projection lithography; micro-actuator; nano-fabrication; nano-manipulation; nano-tweezers; proton beam writing; shape memory effect;
fLanguage
English
Publisher
ieee
Conference_Titel
Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2014 International Conference on
Type
conf
DOI
10.1109/3M-NANO.2014.7057348
Filename
7057348
Link To Document