• DocumentCode
    357593
  • Title

    Solution of potential distributions excited by multi-double layers in 2-D vertically-stratified inhomogeneous media

  • Author

    Pan Jin ; Nie Zaiping

  • Author_Institution
    Dept. of Microwave Eng., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
  • Volume
    3
  • fYear
    2000
  • fDate
    16-21 July 2000
  • Firstpage
    1574
  • Abstract
    The research background of the work is concerned with the spontaneous potential (SP) log, which has endured as an important downhole logging measurement. The fundamental problem for an SP log is about to find the potential distributions excited by multi-double layers at the interfaces in 2-D inhomogeneous media, which simulate a stack of beds penetrated by a borehole and both vertical and radial conductivity variations. For such a model, the typical means to solve the problem was usually with 2-D FD and integral equation methods, which were time consuming and always accompanied by simplification of the models. In this paper we expand the use of the NMM method in double-layer excitation situations to give a highly efficient way to solve the complex boundary-value problem with more general models by strictly matching the horizontal boundaries and exciting conditions.
  • Keywords
    boundary-value problems; electromagnetic field theory; geophysical prospecting; inhomogeneous media; terrestrial electricity; 2-D inhomogeneous media; 2-D vertically-stratified inhomogeneous media; NMM method; SP log; borehole; complex boundary-value problem; conductivity; double-layer excitation situations; downhole logging measurement; exciting conditions; horizontal boundaries; multi-double layers; potential distributions; spontaneous potential log; Conductivity; Eigenvalues and eigenfunctions; Integral equations; Mathematics; Microwave technology; Nonhomogeneous media; Partial response channels; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Antennas and Propagation Society International Symposium, 2000. IEEE
  • Conference_Location
    Salt Lake City, UT, USA
  • Print_ISBN
    0-7803-6369-8
  • Type

    conf

  • DOI
    10.1109/APS.2000.874528
  • Filename
    874528