Comparison of S-Parameter Measurements at Millimeter Wavelengths Between INRIM and NMC

Author

Sellone, M. ; Oberto, L. ; Yueyan Shan ; Yu Song Meng ; Brunetti, L. ; Shoaib, Nosherwan

Author_Institution

Electromagn. Div., Ist. Naz. di Ricerca Metrol., Turin, Italy

Volume

63

Issue

7

fYear

2014

fDate

Jul-14

Firstpage

1810

Lastpage

1817

Abstract

This paper describes a bilateral comparison between two national metrology institutes, National Metrology Center from Singapore and Istituto Nazionale di Ricerca Metrologica from Italy. The measurands of the comparison are the scattering parameter magnitudes of waveguide components of type WR15 (50-75 GHz) and WR10 (75-110 GHz). This comparison is, to the best of our knowledge, the first of this kind performed so far. The measurement results are also compared with electromagnetic computations based on mechanical measurements on a subset of the traveling standards.

Keywords

S-parameters; electric variables measurement; measurement standards; microwave measurement; millimetre wave measurement; INRIM; NMC; S-parameter measurements; WR10; WR15; frequency 50 GHz to 75 GHz; frequency 75 GHz to 110 GHz; millimeter wave measurement; scattering parameter magnitude; traveling standards; waveguide components; Calibration; Measurement uncertainty; Metrology; Millimeter wave measurements; Scattering parameters; Standards; Uncertainty; Measurement uncertainty; metrology; microwave measurement; millimeter wave measurements; scattering parameters; scattering parameters.;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2013.2293227

Filename

6690236