Characterization of ZnO thin films grown by linear sweep voltammetry

By using a linear sweep voltammetry technique, ZnO nanostructured thin films with average diameter of less than 100 nm were synthesized from nitrate aqueous solution on FTO substrate. The effects of electrodeposition parameters such as sweep rate and number of scans were investigated by scanning electron microscopy (SEM), X-ray diffraction and ultraviolet visible transmission spectroscopy. The deposited films show hexagonal Zincite structure and a high transmittance up to 85% in the near infrared and part of the visible region. The results reveal that the electrodeposition parameters have significant influence on the morphology, the average diameter and the shape of ZnO Crystallite. In addition, the optical properties of grown films were strongly affected by the sweep rate parameter.