DocumentCode :
357774
Title :
A new surface measurement method for large reflector millimeter-wavelength antennas using REV method
Author :
Mizuno, T. ; Deguchi, H. ; Naito, I. ; Makino, S. ; Matsumoto, S. ; Aoki, K. ; Urasaki, S. ; Ishiguro, M.
Author_Institution :
Mitsubishi Electr. Corp., Kanagawa, Japan
Volume :
2
fYear :
2000
fDate :
16-21 July 2000
Firstpage :
834
Abstract :
We propose a new indoor surface measurement method using the REV (Rotating Element-field Vector) method. In contrast to the standard holographic methods, in which both amplitude and phase are measured, the REV method requires only amplitude measurement. In this paper, properties of the proposed method are studied by simulation, and main error factors that are inherent in this method are discussed.
Keywords :
millimetre wave antennas; reflector antennas; surface topography measurement; MM wave antenna; REV method; amplitude measurement; indoor surface measurement method; large reflector antenna; millimeter-wave antenna; rotating element-field vector method; Antenna arrays; Antenna measurements; Aperture antennas; Millimeter wave measurements; Millimeter wave technology; Mirrors; Phase measurement; Phased arrays; Receiving antennas; Reflector antennas;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Antennas and Propagation Society International Symposium, 2000. IEEE
Conference_Location :
Salt Lake City, UT, USA
Print_ISBN :
0-7803-6369-8
Type :
conf
DOI :
10.1109/APS.2000.875344
Filename :
875344
Link To Document :
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