Title :
A novel loss evaluation method for differential transmission lines
Author :
Ping Chen ; Wei Mo ; Yi Liu
Author_Institution :
Sch. of Microelectron., Xidian Univ., Xi´an, China
Abstract :
This paper proposes a novel loss evaluating method considering coupling effects based on a parallel RLC differential transmission line (DTL) model in nanometer CMOS process. Through extracting the coupling parasitical parameters, the decoupling partial differential equations of transmission lines are established, thus a loss evaluating expression is proposed. The analytical method enables the estimation of the loss within 6.48% average error compared with measured results in 180nm CMOS process and 5.20% average error compared with HFSS simulation in 65nm CMOS process.
Keywords :
CMOS integrated circuits; RLC circuits; integrated circuit modelling; partial differential equations; CMOS; DTL; HFSS simulation; coupling effects; differential transmission lines; loss evaluation; parallel RLC differential transmission line; partial differential equations; size 180 nm; size 65 nm; CMOS integrated circuits; RLC model; differential transmission lines; loss evaluating; skin effect;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061070
