Title :
Unusual latch-up phenomenon and a novel solution without an additional cost
Author :
Suzuki, Teruo ; Tomita, Mitsuhiro ; Tajima, Shogo
Author_Institution :
Adv. Technol. Dev. Dept., Fujitsu Semicond. Ltd., Tokyo, Japan
Abstract :
An unusual latch-up phenomenon in a microcontroller with a built-in flash memory was detected. The root cause was identified by TCAD simulation and the latch-up mechanism was explained. A novel solution without additional cost was proposed. After applying this solution, the latch-up immunity was dramatically improved.
Keywords :
flash memories; microcontrollers; technology CAD (electronics); TCAD simulation; built-in flash memory; microcontroller; unusual latch-up phenomenon; Bipolar transistors; Earth Observing System; Microcontrollers; Read only memory; TCAD; latch-up; microcontroller with built-in flash memory;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061071
