Title :
Performance comparison of MIM and MIS diodes for energy harvesting applications
Author :
Rawal, Yaksh ; Manik, Prashanth P. ; Bhatt, Piyush ; Anoop, C. ; Lodha, Saurabh ; Ganguly, Swaroop ; Baghini, Maryam Shojaei ; Burman, Debashree
Author_Institution :
Dept. of Electr. Eng., IIT-Bombay, Mumbai, India
Abstract :
Scavenging energy from electromagnetic waves is one of the emerging areas for low-power energy harvesting. The wave is received by an antenna and is then rectified using nonlinear devices for generating required DC voltages. In addition to the traditional diodes other rectifying elements with different structures are exploited to get reduced turn-on voltage and enhanced operating frequency range. For example metal-insulator-metal (MIM) diodes, which work on the principles of the quantum mechanical tunneling, are able to rectify the signals. In this direction this paper presents fabrication and characterization of tunneling-based rectifying MIM, metal-insulator-semiconductor (MIS) and metal-semiconductor (MS) Schottky diodes. Presented MIM tunnel diodes are made using Ti-TiO2-Al and Ti-TiO2-Pt stacks, while MIS and MS diodes are fabricated using Si as well as Ge substrates. Measurement results show that Ge p+n and Si MIS provide higher output DC voltage as compared to Si pn diodes. MIM diodes operate at a wider frequency range as compared to other devices.
Keywords :
MIM devices; MIS devices; Schottky diodes; aluminium; energy harvesting; platinum; titanium compounds; tunnel diodes; MIM diodes; MIM tunnel diodes; MIS Schottky diodes; MS diodes; Ti-TiO2-Al; Ti-TiO2-Pt; electromagnetic waves; energy scavenging; low-power energy harvesting; metal-insulator-metal diodes; metal-insulator-semiconductor Schottky diodes; metal-semiconductor Schottky diodes; quantum mechanical tunneling; rectifying elements; reduced turn-on voltage; tunneling-based rectifying MIM; Charge measurement; Current measurement; Manipulators; Performance evaluation; Schottky diodes; Energy Harvesting; Rectenna; Rectifier;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061102