A new op-amp noise model for switched-capacitor sigma-delta modulator in SIMULINK

Author

Wu, F. ; Chen, Z.J. ; Zhao, M. ; Xu, D.Y. ; Shen, G.C. ; Lu, W.G. ; Zhang, Y.C.

Author_Institution

Sch. of Electron. & Comput. Eng., Peking Univ., Shenzhen, China

fYear

2014

Firstpage

1

Lastpage

2

Abstract

Precise behavioral models are needed to simulate switched-capacitor sigma-delta modulators more efficiently. This paper presents a new noise model of the operational amplifier (op-amp) used in a typical correlated double sampling (CDS) integrator. Evaluation and validation of the new model are done via behavioral and transistor-level simulations for a 2-1 MASH modulator using SIMULINK and SPECTRE with 0.35um CMOS technology. Two sets of results for comparison are obtained and the biggest difference between the two simulators is around 2dB.

Keywords

CMOS integrated circuits; integrated circuit modelling; integrating circuits; modulators; operational amplifiers; sigma-delta modulation; switched capacitor networks; SIMULINK; correlated double sampling integrator; op-amp noise model; operational amplifier; size 0.35 mum; switched-capacitor sigma-delta modulator; Accelerometers; CMOS integrated circuits; CMOS technology; Capacitance; Switches; SIMULINK; correlated double sampling; non-ideality; op-amp noise; sigma delta modulators;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on

Type

conf

DOI

10.1109/EDSSC.2014.7061122

Filename

7061122