Title :
A new op-amp noise model for switched-capacitor sigma-delta modulator in SIMULINK
Author :
Wu, F. ; Chen, Z.J. ; Zhao, M. ; Xu, D.Y. ; Shen, G.C. ; Lu, W.G. ; Zhang, Y.C.
Author_Institution :
Sch. of Electron. & Comput. Eng., Peking Univ., Shenzhen, China
Abstract :
Precise behavioral models are needed to simulate switched-capacitor sigma-delta modulators more efficiently. This paper presents a new noise model of the operational amplifier (op-amp) used in a typical correlated double sampling (CDS) integrator. Evaluation and validation of the new model are done via behavioral and transistor-level simulations for a 2-1 MASH modulator using SIMULINK and SPECTRE with 0.35um CMOS technology. Two sets of results for comparison are obtained and the biggest difference between the two simulators is around 2dB.
Keywords :
CMOS integrated circuits; integrated circuit modelling; integrating circuits; modulators; operational amplifiers; sigma-delta modulation; switched capacitor networks; SIMULINK; correlated double sampling integrator; op-amp noise model; operational amplifier; size 0.35 mum; switched-capacitor sigma-delta modulator; Accelerometers; CMOS integrated circuits; CMOS technology; Capacitance; Switches; SIMULINK; correlated double sampling; non-ideality; op-amp noise; sigma delta modulators;
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2014 IEEE International Conference on
DOI :
10.1109/EDSSC.2014.7061122
